System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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NI-9251, 3 Vrms, 102.4 kS/s/ch Simultaneous, 2-Channel C Series Voltage Input Module
783814-01
3 Vrms, 102.4 kS/s/ch Simultaneous, 2-Channel C Series Voltage Input Module - The NI‑9251 with mini XLR is a low-distortion input channel that allows for the high dynamic range measurements necessary to fully test and evaluate modern audio outputs used in most consumer electronic devices. Unlike sound card-based solutions, you can quickly deploy the NI‑9251 to guarantee long-term measurement repeatability and increased test system uptime. To maximize low-noise benefits, the NI‑9251 differential input is provided through a mini‑XLR connector, which delivers a truly balanced input.
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Three-phase Protection Relay Test Set/Kit
POM2-3243
POM2 series protection relay test kit is the best modular designed relay tester with local control system. There are 2 models, the POM2-6143 and POM2-3243, the POM2-3243 with 3×20A and 4×300V.
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Double Taper Horn Antenna
MDTH series
This product is the antenna that corresponds to the radar pulse immunity test for automotive equipments. Automotive manufacturers have required the electric field strength of 600 v/m. Amplifier system and cable will be cheaper, and will contribute to the ecology.
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PCI Resistor Card 2-Channel 1.5 Ohm To 1.02k Ohm With SPDT
50-293-121
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Battery (EV) Automatic Test System
Landrex Technologies Co., Ltd.
Battery (EV) Automatic Test System
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High Current Test System
HIGHVOLT Prüftechnik Dresden GmbH
High current test systems are used to test the thermal stability of equipment and components. The test system induces a current in the test object causing it to heat up. Therefore, the test object is designed as a shorted circuit. The high current test system measures the temperature of the test object at various points, in addition to the current. As a special feature, the temperature that the test object should reach can be specified and the amount of the current can be automatically calculated by the HIGHVOLT test system.
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NI-9229, ±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module
779785-01
±60 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Module - The NI‑9229 performs differential analog input. The NI‑9229 is an effective general-purpose analog module because of its resolution, sample rate, and input range. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating.
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High-performance multifunctional AC Power Supplies (CV/CF)
PCR-LE Series
The PCR-LE Series is a new line of advanced multifunctional AC power supply that has been developed from our PCR-L/LA Series (linear amplifier type). The PCR-LE Series provides high reliability and can be applied to various applications, by taking advantage of the features that can control broadband waveform freely. Moreover, the PCR-LE Series can be configured as a core device of a test system combined with E-loads and Power Analyzers for “Grid Connection Testing” in regard to dispersed power g...show more -
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Boundary Scan Program Development Service
No need for test fixtures. Integrates product development, production test, and device programming in one system. Test and Programming data can be reused in Production. Fast test procedure development. Reduced inventory management. Eliminates or reduces ICT usage time. Pre-production testing can begin as soon as prototype is released.
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Analog Bus Extension for PXI
ABex
The ABex (Analog Bus Extension for PXI) is an exceptional test platform that extends to accelerate productivity, development throughput and time to market. Applicable in various industries and technological fields, this platform covers complex test challenges anywhere on the production line.Due to its flexible system architecture with an analog bus backplane and terminal modules, the platform allows the integration of technology specific extensions and extremely short system set up times which result in a reduction of total system costs.
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Nuclear EMC Testing Services
The implementation of digital control and monitoring systems in nuclear power plants drives EMC requirements for new and replacement equipment to be used in nuclear plants. For the past 20 years, the Electric Power Research Institute (EPRI) has been developing test methods to demonstrate compliance with EMC requirements. The methods and limits are called out in EPRI TR-102323. The first issue of this report was released in 1994 and the current revision (Revision 4) was released in 2013. The original report and basis included results from electromagnetic surveys at seven nuclear power plants in the United States.
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Instrument Bracket Kit, w/ Strain Relief, Slide Configuration, for 28"+ Slide Kits
310113002
Instrument Bracket Kit, w/ Strain Relief, Slide Configuration, for 28"+ Slide Kits Similar to instrument bracket p/n 310113453, but includes cutout to accommodate air intake on NI PXIe-1088 chassis. Only compatible with slide configurations 28" and longer. Not compatible with cable tray. Not recommended for use with 2+ tier 90 Series systems (905, 9075, etc.).Used to mount testing instrument to slides and also allows test instrument to slide out for maintenance access. Provides strain relief in front area of bracket. Compatible with chassis (see drawing for more information)
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Linear Power Supplies Precision, GPIB or Local Control, Ultra Low Ripple/Noise
Series ATE-DMG
Kepco's 1000 watt instrument-grade digital power supplies, Series ATE-DMG, are linear low-noise power supplies designed to respond very quickly and precisely to voltage and current setting instructions delivered interactively by the GPIB (IEEE 488.2) or from a front panel keypad. When programmed from the bus, the ATE-DMG power supplies respond to the SCPI (Standard Commands for Programmable Instruments) common language for instruments used in an automatic test system.
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Transformer Tester
MOTOMEA Distribution Transformer Test Systems: Routine Testing for Production (EOL) and Quality Assurance (QA). Type Testing at Laboratory (R&D)
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SSFDR Software Integration Rig
MS 1112
Software Integration Rig (SIR) is an Industrial PC based system is used to test the SSFDR (Solid State Flight Data Recorder) of SU30 Aircraft. SIR is a PXI based test platform and it is used to test independent and integrated software tests of the SSFDR.
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Powered VME64x Crates
6U VME64x 6023
The WIENER VME 6023 crate series is the newest generation of 19" integrated packaging system for standard VME/VME64 bus systems with 6Ux160mm cards. Designed primarily for applications in data acquisition, control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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FaithTech FTLP Series 100W/180W Portable Programmable DC Power Supply
FaithTech FTLP Series
Shenzhen FaithTech Technology Co., Ltd.
FTLP series is a kind of programmable Portable bench DC power supply, with the widest output range, which allows engineers to test more program requirements with just one device. To be exact, the FTLP series provides full power all the way down to 25% of the rated output voltage. The FTLP series is equipped with RS232 and RS485 as standard interfaces that are essential for system integration, you can also choose USB or LAN interface as your add-on interfa...show more -
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Genrad 2270 Interface Receivers
GR Series
The 3210 Series Receiver is designed for interfacing the GR 2270 style test fixture. Using patented CAM/TRAC design, the 3210 Receiver provides an accurate, positive locking system that ensures consistent contact throughout the entire interface. With a 5/8" stroke, the 3212 Receiver allows additional clearance for coax and custom block applications.
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Test Solution
Eye-BERT MicroX
The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions. The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps. Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-t...show more -
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MCB Magnetic (Instantaneous) Trip Test Bench
The test bench is specially built for low voltage- B, C & D curve MCBs. Specially designed custom built jigs are able to accommodate single, double, three and four pole MCBs. Decades of experience has helped us to design current source (transformer) in a special way such that good current regulation and high accuracy is ensured with a variable range without the use of any variable transformer in the system. The product is better than the competition with conventional technology at a lesser price!
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PXIe-1095, 18-Slot (5 Hybrid Slots, 11 PXI Express Slots, 1 PXI Express System Timing Slot), Up to 24 GB/s PXI Chassis
785971-01
PXIe, 18-Slot (5 Hybrid Slots, 11 PXI Express Slots, 1 PXI Express System Timing Slot), Up to 24 GB/s PXI Chassis - The PXIe-1095 features a high-bandwidth backplane and up to 82 W of power and cooling in every slot to meet a wide range of high-performance test and measurement application needs. The chassis incorporates two hot-swappable power supplies to improve the mean time to repair (MTTR) of the PXI system; it also offers a Timing and Synchronization option that includes a built-in oven-con...show more -
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GPIB-ENET/1000, Ethernet GPIB Instrument Control Device - Swiss 220VAC
781630-02
The GPIB‑ENET/1000 is an IEEE 488 controller device for computers with an Ethernet port. You can use this device to share a single GPIB system among many networked users or to control several test systems from a single networked host. The GPIB‑ENET/1000 features a password-protected web interface for easy configuration. It can also control IEEE 488 devices from anywhere on an Ethernet‑based (LAN) TCP/IP network (Gigabit, 100BASE‑TX, 10BASE‑T). Each device interfaces to and shares up to 14 GPIB d...show more -
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Battery Module (60v-300v) Test System
Shenzhen Sinexcel RE Equipment CO., Ltd
The module test equipment adopts sinexcel advanced high frequency isolation scheme, and the detection process supports multi-gear switching. The equipment integrates voltage, temperature, pressure and other auxiliary channels, and can also integrate temperature box, water cooler and other equipment, 20ms high-speed working condition simulation and other practical innovative functions to meet all aspects of battery electrical performance testing.
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PXI Voltage Amplifier 10K Ohm, SMB
41-650-012
The 41-650 is a 5 channel voltage amplifier ideal for increasing the output voltage from other PXI modules, enabling users to easily generate the signal voltages commonly required in applications such as automotive test. Each amplifier can be independently programmed to a gain of 1, 2, 5, 10 or 20, enabling it to be used with modules with low output voltage capability. Inputs and outputs can be provided either on SMB connectors or on a D Type connector to suite the user’s wiring system.
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Flash Programming for Functional Test Systems
Flash programming stations allow you to offload flash programming from functional test systems, increasing test throughput while improving capital utilization. Circuit Check flash programmer fixtures support multiple programmer types and multiple I/O configurations.
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High-acceleration Shock Tester
DP-1200-18
King Design Industrial Co., Ltd.
The precise-type high-acceleration shock tester can provide all half-sine short wave specification specified in JESD22-B110. To meet them, merely change different shock rubber-pad on shock seat. The wave is complete with high repeatability, able to provide user accurate test result.Conform to different test specs such as JESD22-B110 and IEC spec.High repeatability on consecutive shock; acceleration +/- 10%; run time +/- 15%; speed deviation +/- 10%.Table’s four corner-points uniformity P160mm +/...show more -
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Digital I/O Vector Development Software
DIOEasy
DIOEasy offers test engineers an efficient tool for developing, debugging, and executing digital test vectors for Marvin Test Solutions' GX5050 series, GX5150 series, GX5280 series and GX5291, GX5292, GX5293 and GX5295 dynamic digital instruments.Digital I/O (DIO) systems are very complex and typically require a substantial amount of programming effort to define data vectors. In order to simplify vector development, Marvin Test Solutions developed Windows-based DIOEasy, providing users with an easy to use interface. Toolbars and menus provide quick access to vector editing and viewing tools.
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PCI High Density Potentiometer Card 2-Channel, 16-Bit, 0 To 65k Ohm
50-296A-021-2/16
The 50-296A series are Programmable Potentiometer versions of the 50-295A Programmable Resistor cards with up to 9-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXI/PXIe MEMS RF Multiplexer, Quad 4-Channel, 4GHz, 50Ω, MCX
40-878-242
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Benchtop Thermal Forcing System
Wewon Environmental Chambers Co, Ltd.
Benchtop thermal forcing system from Wewon Environmental Chambers Co., Ltd. has a mini body structure and affordable machine price. The machine can test a wide temperature range, Since no compressor is required for refrigeration, so the benchtop temperature forcing unit’s energy consumption is very low. The repeated resistance degree of the tested sample in the instantaneous extremely high temperature and extremely low temperature continuous environment can detect the chemical changes and physic...show more